期刊刊名：科學與工程技術期刊 　 卷期：4卷4期

篇名出版日期：2008年12月1日

作者：JIUN-YEU CHEN,JIA-YI YEH,CHIN-TIEN LIN,MING-YING HSU,陳俊宇,葉佳益,林金田,徐名瑩

語言：English

關鍵字：form-birefringence,chiral photonic structure,defect mode,high-spatial-frequency grating,形狀雙折射,手徵光子結構,缺陷模態,高空間頻率光柵

被點閱次數：3次

閱讀時間：106sec

摘要：
Photonic localization in a chiral photonic structure with defective high-spatial-frequency gratings was investigated by using the finite element method. The form-birefringence effect, caused by grating high-spatial frequency, is introduced into the chiral structure by modifying the grating parameters, such as groove depth, filling factor, and refractive index of the intermixing material. This defect gives rise to a peak in transmission for circularly-polarized light having the same handedness as the helical structure. The artificial dielectrics, caused by the form-birefringence effect, play a fundamental role in restraining and manipulating light to affect the location, power transmittance and phase retardation of the defect mode. By changing the intermixing material of the grating into a different medium, the linearity of the sweep in a defective wavelength depends on the refractive index of the medium. This procedure can be applied to real photonic devices. For example, an optical refractometer or a (bio-)chemical sensor can be designed by replacing the intermixing material by the medium to be measured.

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