+ HOU-MING CHEN
HOU-MING CHEN在資料庫中的所有著作一覽
篇名作者刊名卷期出版年份
A Powerful Electrical Probing Method to Detect the Kink Effect of MOSFET Devices=一種強有力的電子量測法以偵測場效電晶體元件的捲縮效應MU-CHUN WANG, HOU-MING CHEN, CHENG-TSUN TSAI, YUNG-CHEN CHEN,LIANG-TE LU,王木俊,陳厚銘,蔡政村,陳永珍,呂良德大葉學報 13卷1期1992/12/1